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Data from: Magnetically modified double slit-based X-ray interferometry

Data files

Mar 25, 2026 version files 66.10 KB

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Abstract

We performed x-ray based double slit diffraction with one of the slits covered with magnetic material. We then performed the experiment and collected double slit diffraction pattern as a function of external applied field. The dataset included here shows how the fringe moves as a function of applied field and how we can extract optical constant and ultimately relate to magnetization.